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The following Field-Effect Transistor (FET) models are supported in IC-CAP.
| Model | Product Description |
|---|---|
| Keysight EEFET3, Keysight EEHEMT1, Curtice cubic and quadratic, Raytheon’s Statz | Complete measurement and extraction procedure for the supported models. |
| Keysight Root FET, MOS and Diode | Automated modeling procedure for DC and RF 3-terminal applications using interpolative spline fitting of S-parameters and DC data arrays over the device's operating range. This license also includes extraction for Keysight Root Diode and MOS models. |
| Angelov-GaN | Accurate turn-key measurement and extraction solution for the Angelov-GaN model |
For more information about Device Modeling software, please visit Device Modeling IC-CAP.
Featured Resources for FET Modeling
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