How to Speed Up Short Testing for High-Impedance Nodes

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i3070 Series 7i In-Circuit Tester
+ In-Circuit Tester
i3070 Series 7i In-Circuit Tester
+ In-Circuit Tester

Testing high-impedance nodes with an enhanced short test algorithm

Testing printed circuit board assemblies (PCBAs) for electrical shorts requires measuring the resistance between isolated nodes. This method involves injecting a small current through the circuit and checking the resulting impedance between nodes. However, short testing for high-impedance nodes requires a much more precise measurement method to detect the minute impedance changes.

Short testing of high-impedance nodes requires an extended time to stabilize voltage or current for an accurate reading. Due to the node’s increased sensitivity, maintaining signal stability and minimizing external influences are crucial aspects of the testing process. The prolonged short test duration for high-impedance nodes does not align with high-volume manufacturing.

E9988GL

Enhanced short test solution

Testing high-impedance nodes for an electrical short requires a longer time to stabilize voltage or current for an accurate reading. The Keysight i3070 High-Density In-Circuit Test (ICT) System has an enhanced electrical short testing algorithm that significantly improves test time. A more efficient test cycle is achieved by vastly reducing the number of iterations required to identify shorts in the high-impedance nodes. This advancement reduces test time without compromising the test’s integrity. This enhanced test algorithm comprises two phases — detection and isolation phases. The new algorithm improved throughput by 30% to 50% in lab tests.
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