Precision Meets Efficiency: The Ultimate On-Wafer Testing Solution
Flyers
MSTECH’s MST3000A on-wafer probe station, combined with Keysight’s PZ2100 series SMUs, delivers a robust and versatile testing solution. The PZ2100 series supports up to 210 V, 3.5 A DC, and 10.5 A pulse performance, catering to a wide range of devices. The MST3000A ensures precise, low-noise data acquisition with high repeatability, excelling in applications such as semiconductor material evaluation and MEMS performance testing. This integrated system meets the evolving demands of cutting-edge testing environments with high accuracy, reliability, and a space-saving design. Additionally, Keysight’s PathWave IV Curve Measurement software enhances productivity with seamless, programming-free operation, making it an ideal choice for labs and production lines.