B2900B/BL Precision Source/Measure Unit (SMU)

B2900B/BL Precision Source/Measure Unit (SMU)

Product Fact Sheets

B2900B/BL series Graphical SMU solves precision measurement challenges and improve test efficiency from lab to manufacturing for a wide range of applications at the cost performance

 

Broad application by a single instrument

 

• Wide application coverage by integrated 4-quadrant source / measure capabilities up to 210 V, 3 A DC/10.5 A pulsed

• Flexible output waveform by pulse, sweep and list sweep function

 

Capturing true characteristics with superior high speed digitizing and high resolution

 

• High sourcing and measurement resolution: 10 fA/100 nV

• Fast setting/digitizing interval 10 μs/100 kpts/s

 

Test time reduction

 

• Fastest sweep measurement available in a benchtop SMU

• Reducing execution time of repeated test commands by programming memory

 

Test efficiency improvement

 

• Innovative GUI: I-V (current - voltage) measurement without PC programming

• Multiple software control options, allowing you to choose the solution that best fits your particular application

 

Typical applications

 

• Optical devices (laser diodes, photo diodes)

• Organic devices (OLEDs)

• Photovoltaic (solar) cells

• Nano-technology materials

• Power management devices (LDOs)

• Semiconductor devices (FETs, transistors)

• Resistors, diodes, varistors, and other component devices