Added to favorites
Removed from favorites
Benefits of De-Embedding and Match-Corrected Measurements
A fundamental aspect of verifying wireless designs is measurement, which enables characterization of a device under test (DUT). The goal is to isolate and measure the DUT itself, but this is not always straightforward in practice. The combination of VNAs, external reflectometers and the expertise to generate and apply the corrections can help in measurement setups, but it can be complex to do this in-situ. One innovative solution to this challenge is the incorporation of a reflectometer directly into the signal generator. This integrated approach enables in-situ generation of a match corrected signal incident to current load with a single button press. The inclusion of an embedded reflectometer in the N5186A MXG vector signal generator demonstrates Keysight’s commitment to improving measurement accuracy.
