segmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Test_Automation_Software,segmentation:product-category/Test_Automation_Software/SW_Oscilloscopes_BERTs_AWGs,segmentation:business-unit/CSG,segmentation:funnel/mofu,segmentation:search-relevance-product/software,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/conformance-and-compliance,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:product-lines/1a,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/industry/semiconductor
DDR5トランスミッターコンプライアンスのテスト方法
DDR5トランスミッターと他のデバイスとの相互運用性を確保するためには、JEDECコンフォーマンス規格に準拠した大規模なテストが必要となります。 高帯域幅オシロスコープとプローブを使用し、インターポーザボードを使用してシリコンにできるだけ近い位置でプロービングを行い、コンプライアンスに必要なコンフォーマンス測定とテストケースを徹底的にテストする方法についてご確認ください。
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