M9195B PXIe Digital Stimulus/Response Module

M9195B PXIe Digital Stimulus/Response Module

Data Sheets

M9195B PXIe Digital Stimulus/Response Module

16-channel, 250 MHz, PPMU

Overview

Experience high speed digital test capabilities at a whole new level. The Keysight Technologies, Inc. M9195B PXIe Digital Stimulus/Response (PXI DSR) module is ideal for IC design validation and production test environments. It goes beyond providing just standard capabilities. The new 16-channel, single slot PXI module introduces a high-performance pattern cyclizer for powerful pattern creation including advanced timing capabilities such as multiple drive edges per cycle. This provides flexible edge placement and stimulus/response delays for timing margin testing or cable length compensation. Additionally, it can support up to four independent multi-sites with an independent sequencer for each site.

Software tools included with the M9195B allow the user to modify vector and pattern parameters without requiring the user to recompile and download tests. An optional set of software tools include a graphical pattern editor and pattern conversion tools to speed test development by enabling test patterns from various EDA systems to be read in, edited, and output to the M9195B.

Additional ATE features include:

  • High speed pattern application and RZ (Return-to-Zero) clock rate up to 250 MHz
  • Per pin programming of voltage levels
  • Real time compare, parametric measurement unit (PPMU)
  • Deep vector memory and flexible pattern sequencing

With the PXI DSR module you can easily emulate standard serial interfaces like the MIPI® RF Front-End interface or proprietary parallel device interfaces. The test development software tools enable you to quickly create and edit waveform patterns or to import patterns created by automatic test generation applications.

Applications

  • RFFE bus emulation used in PA/FEM semiconductor device verification or production test
  • Wireless communication devices using parallel or serial digital control
  • Automated test in product validation or manufacturing test
  • Backplane emulation for device, board, or module testing
  • Digital serial and parallel applications

Key Features

  • Combine modules to form systems of up to 192 channels (requires option MMS)
  • 16 bidirectional channels with per-pin programmable logic levels
  • Highly flexible, per-bit timing control for fast and accurate waveform development
  • Reconfigurable per-pin Parametric Measurement Unit (PPMU) for each channel
  • Single and multi-site configurations
  • Edit patterns on-the-fly without recompiling and downloading the test
  • Execute patterns in arbitrary order
  • Flexible allocation of deep pattern memory per channel or per site to allocate memory where it is needed
  • Channel delay adjustment to compensate for cable and fixture propagation delays
  • 4 high voltage channels for flash programming or fuse test
  • 4 open drain auxiliary output pins for fixture relays
  • Hardware triggers and markers for test system synchronization
  • Comprehensive software tool set for quick test development

M9195B Hardware Overview Individual channel capability

Each of the 16 bidirectional channels provide programmable logic levels of –1.5 V to +6.5 V with 152 μV resolution. The per channel 4 quadrant parametric measurement unit (PPMU) enables FVMI, FIMV, FVMV, and FIMI and FNMV modes. With the 5 PPMU current ranges between ±2 μA to ±40 mA, users can make accurate leakage measurements.

Each channel can be configured for parametric measurements, as a static digital I/O pin, or with synchronized cyclized digital data. This allows you to mix-and-match channels as required.

Digital channel direction and timing can be flexibly controlled on a per digital vector basis. The cyclized data allows each pin to operate in RZ or NRZ modes. In combination with the 1 ns edge placement resolution, each pin allows for an adjustable output delay, for timing margin testing, and receive delay to compensate for cabling propagation delays.

Multi-site capability

The PXI DSR provides a choice of a single-site configuration with 16 synchronized channels, or a multi-site configuration with 4 sets of 4 synchronized channels. In multi-site mode, each site has its own independent sequencer. This enables site independent clock operation for simultaneous testing. The multi-site capability simplifies test development. Instead of forcing the test engineer to create a single test that encompasses all for sites simultaneously, the user only needs to focus on a single device. The single device test can be easily replicated for the remaining test sites. In addition to the digital pins, each site has a high voltage drive channel and an open drain control channel for relay control.

Multi-module synchronization

Up to 12 modules can be combined to build systems up to 192 channels (requires opt MMS for each module plus the appropriate sync cable, either Y1250A or Y1251A). When modules are combined, they operate in single-site mode and all channels are synchronized to a single test sequencer. Typical channel-to-channel skew (including across modules) is ±300 ps. Multiple modules are combined and programmed together into a single multi-module instrument.