PathWave WaferPro Software

PathWave WaferPro Software

Automated on-wafer measurement software

Simplify Your Test Software Integration

Many R&D device characterization labs develop custom software to drive and control instruments, switch matrices, and probe stations using various languages such as Perl, MATLAB, LabVIEW, C#, or Python. In-house software allows lab managers to control new features, custom drivers, data handling, etc. While this may seem like an attractive solution, the challenges of prober and measurement integration are complex and often result in high hidden costs. Developing a mature measurement software can take months, months better spent optimizing your devices, circuits, and systems. Today, an ideal solution contains built-in measurement routines and a flexible and powerful programming environment to enable more challenging and specialized measurements.

PathWave WaferPro offers that solution by enabling measurement automation, wafer prober control, and data ready for modeling. Furthermore, your test plans may be easily scaled across your lab. PathWave WaferPro provides a unified measurement platform that eliminates the complexity of software integration, allowing an engineer to set up and execute wafer-level measurements of semiconductor devices. The modern and intuitive user interface propels your lab into the next generation of innovation by reducing necessary set-up steps, thus saving time and money.

Features at a glance

• Simplify automated measurements with an easy-to-use modern interface.

• Control wafer temperature and prober chuck positioning automatically.

• Access an extensive library of configurations for semiconductor devices to execute S-parameters quickly, DC-IV, CV, noise figure, 1/f noise, gain compression, and more.

• Reduce development time for new tests with highly efficient turnkey drivers.

• Design and implement custom drivers and tests with Python or PEL and save measured data to ASCII files or SQL database format.

• Leverage drivers highly optimized for FormFactor wafer probers and other prober manufacturers.

• Visualize data across your wafer using a wafer data mapping viewer.

• Easily export your data to modeling platforms such as Keysight’s PathWave Device Modeling (ICCAP) and PathWave Model Builder (MBP).

• Python 3 enables instrument links, customized measurement algorithms, and data processing.

• Support promoted PXIe SMU add-on for A-LFNA.

Feature Overview

PathWave WaferPro provides the ease of use of a test executive combined with power and flexibility to allow engineers to customize analyses and data views. Python 3 allows you to write custom measurement algorithms or data processing. Engineers may save time and money by leveraging built-in features and routines for developing new test sequences.

Product Configuration

Keysight offers three PathWave WaferPro configurations, also called bundles. The W7501B PathWave WaferPro Measurement and Programming bundle executes automated wafer-level measurement with turnkey measurement drivers and measurement routines and uses Python/PEL programming to create custom measurement algorithms. The W7801B PathWave WaferPro WGFMU Measurement bundle executes automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU. The W7802B PathWave WaferPro A-LFNA Measurement and Programming software bundle performs automated low-frequency noise measurements with turnkey measurement drivers and measurement routines for A-LFNA and WGFMU.

W7501B PathWave WaferPro measurement and programming

• Over 50 turnkey measurement drivers fully optimized for speed.

• Support for most industry-standard probers from FormFactor, MPI, Accretech, TEL, and others

• Integrated Wafer map support

• Extensive library of example measurement algorithms

• Python/PEL programming environment

W7801B PathWave WaferPro WGFMU measurement

• Automated measurement without programming

• Auto prober control

• Wafer mapping

• Single data display for multi-decade in the frequency domain

• Upgradeable from your existing B1500A

• Random telegraph noise (RTN) data analysis capabilities like Ton/Toff

W7802B PathWave WaferPro A-LFNA measurement and programming

• Seamless integration with the PathWave WaferPro measurement platform

• Advanced data display and analysis, enabling noise data comparisons and modeling with respect to bias current

• Automated control of all major wafer probing systems

• LFNA module features DC measurement, 1/f noise, RTN, and data analysis

• Flexible hardware averaging for throughput-accuracy tradeoffs

• Multiple built-in biasing schemes for flicker noise characterization

• Measured data compatible with Keysight device modeling software

• Guided system calibration procedure

• PEL and Python measurement routine language support

• RTN data analysis capabilities like Ton/Toff