M8199A 128/256 GSa/s Arbitrary Waveform Generator

Key Benefits of the New Arbitrary Waveform Generator

• 4 channels at 128 GSa/s or 2 channels 256 GSa/s with up to 70 GHz nominal analog bandwidth

• Provides research engineers a high-performance signal source for arbitrary signals, enabling development of designs up to 140 GBd.

• Keysight’s M8199A 256 GSa/s AWG delivers twice the sampling rate of any AWG on the market today, coupled with at least 50 percent higher analog bandwidth. As a result, research engineers can quickly develop advanced components for terabit transmission systems

• Integrated, ready-to-use instrument

• Operates with well-known software, like MATLAB or Keysight IQTools and 

• SCPI programming interface based on M8070B

• High flexibility with upgrade options from 2 channels at 128 GSa/s to 4 channels at 256 GSa/s

M8199A at a glance

The Keysight M8199A arbitrary waveform generator (AWG) has the highest sample rate and the widest bandwidth in its class with up to four synchronized channels operating simultaneously in one module

• Up to 70 GHz analog bandwidth

• Built-in frequency and phase response calibration for clean output signals 

• 6 bits ENOB, DC to 50 GHz, Fs 100 GSa/s

• Intrinsic jitter: < 75 fs

• Continuous sample rate range: 100 to 128 GSa/s resp. 200 to 256 GSa/s

• Up to 1.4 Vpp differential output voltage @128 GBd 

• Transition time (20/80) as low as 5 ps 

• Channel-to-channel skew adjustment with 25 fs resolution

• Synchronization of up to 16 channels across 4 modules

• < 140 dBc wideband phase noise > 1 MHz

• 512 KSa / 1 MSa of waveform memory per channel

Coherent Optical Applications

800G and 1 Terabit applications demand a new class of generators that provide high speed, precision and flexibility at the same time. The M8199A is the ideal solution to test various optical systems from discrete components like optical power amplifiers to more complex dual polarization systems such as optical modulators or optical receivers. Even for tests of signal processor ASICs or algorithm, the M8199A is an excellent signal source to provide stressed signals to these devices.

With up to 4 channels per 2-slot AXIe module, each running at up to 128 GSa/s with 65 GHz of analog bandwidth, the M8199A allows dual polarization testing in a small form factor and the generation of complex signals with any modulation scheme (QPSK, nQAM, etc.) up to 128 GBd.

Using option ILV boosts the sample rate from 128 GSa/s on 4 channels to 256 GSa/s on two channels.

An optionally available remote head increases the output amplitude so that it can directly drive a modulator amplifier.

Compensation for distortions generated e.g. by cables and amplifiers can be compensated by embedding/de-embedding the S-parameters of the respective circuits or by performing an in-situ calibration using the Keysight Technologies vector signal analysis software.

Multi-Level / Multi-Channel Digital Signals

With increasing data rates in servers and computers, the trace loss increases, which reduces the signalto-noise ratio. Standard modulation formats, such as NRZ or PAM-4 may not be sufficient anymore. Here the M8199A is the right tool that provides the flexibility for advanced research on improved and more advanced modulation formats to boost transmission rates to the next level. For example, high-speed research is already experimenting using PAM-3, PAM-6, PAM-8 or proprietary modulation formats at data rates up to 128 GBd. Interleaving can boost the sample rate to 256 GSa/s, enabling symbol rates beyond 128 GBd. 

The flexibility of the waveform generation with highest speeds, combined with excellent intrinsic jitter performance makes the M8199A a truly unique and versatile instrument. 

At data rates of multiple Gb/s, the effect of cables, board traces, and connectors etc. must be considered in order to generate the desired signal at the test point of the device under test. The M8199A incorporates digital correction techniques for frequency- and phase-response compensation of the AWG output and any external circuit to generate the desired signal at the device under test. Channels can be embedded/de-embedded if the S-parameters of the respective circuits are provided.