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DS1203A High Precision Electromagnetic Probe
Improve side channel analysis with Keysight’s highly sensitive probe
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The DS1203A High Precision Electromagnetic Probe, a highly precise probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits.
Highlights
The High Precision Electromagnetic Probe, a highly sensitive probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits. The probe has a mechanism that allows you to swap out three different probe tips of varying sizes: 0.2 mm, 0.5 mm, and 1.25 mm. All tips have a directed coil and a protective Teflon shell. Normally used in combination with an XYZ-motion platform, the probe can pick up electromagnetic fields with frequencies of up to 6 GHz, converting them into an AC signal.
By moving over the surface of a target, the DS1203A can find highly active circuits, or hotspots. The signals picked up on a hotspot comprise the measurements for simple or differential electromagnetic analysis. The High Precision Electromagnetic Probe has a variable gain mechanism, which you can set by hand or through an external device such as the Spider and can vary based on the target’s characteristics.
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