Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable hardware.

Highlights

Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable pattern and control logic. The DS1160A has integrated circuitry for performing voltage and clock glitching and an output channel for controlling optical pulses on the DS1101A Fault Injection Laser System.

  • Generate very short glitches using FPGA technology in the integrated digital pattern generator for very powerful tests
  • Easily create any test scenario with the perturbation instruction set
  • Reproduce tests with accurate logging of smartcard behavior
  • Reduce testing time with automated testing of a large set of perturbation parameters
  • Seamlessly integrate with DS1002A Pattern Based Trigger Generator and DS1101A Fault Injection Laser System
  • Prevent card damage with adjustable current limiter
  • Reach a high level of assurance with consistent and complete perturbation testing Does not require chip de-packaging

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