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Accelerate semiconductor innovations across your product design and manufacturing cycle. Automate and verify complex device modeling and designs. Leverage an end-to-end modeling solution spanning automated measurements, device model extraction, and qualification to final process design kit validation. With RF-centric design tools, you can improve the efficiency of physical, circuit, and system design and bring your semiconductor designs to life with a complete development ecosystem.

Find Your Semiconductor Test Solution

Revolutionary semiconductor design

Semiconductor modeling and testing innovation

Holistic IP solutions

Accelerated wafer testing efficiency

Parametric testing redefined

Leading-edge functional semiconductor testing

Find the Solution to Your Use Case

Learn how to do the following:

  • Evaluate IV characteristics of LEDs.
  • Test wide-bandgap semiconductors and power modules.
  • Characterize low-power integrated circuits.
Explore semiconductor use cases
A line drawing of a wide-bandgap semiconductor functional test

Discover Keysight's Semiconductor Solutions

Keysight B2900 series SMU hardware and a laptop displaying measurements

LED IV characterization solution

Enables accurate, high-resolution current versus voltage measurements and delivers extensive current and voltage measurement capabilities.

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A picture of Keysight's PD1500A dynamic power device analyzer

Double-pulse test solution

Perform reliable, repeatable measurement of wide-bandgap power semiconductor dynamic characteristics to comply with JEDEC specifications.

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WBG

WBG semiconductor power module tester

Delivers precision SiC semiconductor power module measurements and solves high-side gate voltage characterization challenges with pulse-isolated probe technology.

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A picture of the PZ2100A low-power IC characterization solution and a monitor displaying measurement data

Low-power IC characterization solution

Performs IV characterizations under various operating conditions at extremely low current and voltage levels to validate circuit design, identify faults, and optimize performance.

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Accelerate Development with Keysight Software

Access More Insights and Resources

  • Customer Quote Icon

    “Test time reduced by 50% with a Layer 1 – 7 end-to-end solution.” BYD, one of the largest automobile manufacturers in China who needed to upgrade their cars to Automotive Ethernet communication technology.

    See how they did it

  • Customer Quote Icon

    “Keysight's contributions to the C-V2X standard and broad set of C-V2X test capabilities helped OmniAir establish the world's first C-V2X certification program. We look forward to the next phase, which includes authorizing the first C-V2X test laboratories and certifying C-V2X devices in line with market demand.”

    Jason Conley, Omniair Consortium

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    “Keysight helped us dramatically reduce development time and cost. Our engineers can verify the problems much earlier in the design process and fix the issues with Keysight’s automotive radar test solutions. Our risk of recall has been significantly reduced. With Keysight, our engineers are even more confident that our automotive radars can help save more lives on the road.”

    A Top Global Automotive Maker

  • Customer Quote Icon

    “We were using manual measurement methods to test our DC-DC converters and the turn-around-time was simply too long and incurring high re-current costs. Keysight proposed an automated parallel testing method that could measure 4 DUTs simultaneously. This greatly reduced our test turn-around time (TAT) and helped us save on resources while improving test efficiency.”

    Major Automotive OEM, Japan

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