How to Characterize Low-Loss Materials for 5G

+ PNA Millimeter-wave System

Limiting millimeter-wave signal loss with low-loss material measurement

Characterizing the properties of low-loss materials for 5G communications requires using the resonant cavity measurement method. With this method, a network analyzer measures the resonant frequency and Q factor, the resonant behavior of an underdamped harmonic oscillator, and a resonant cavity fixture. The analyzer then remeasures the frequency and Q factor change caused by the material(s). This method provides one frequency point response.

You can also conduct low-loss material research with other fixtures which are selected depending on the frequency range. Use split post dielectric and perturbation cavity resonator fixtures for low frequencies. These fixtures are suitable for measuring low temperature co-fired ceramic (LTCC) substrates, ferroelectric films, ultrathin films, and 5 ml of powder. Split cylinder, Fabry-Pérot, or balanced circular disk resonator fixtures are suggested for millimeter-wave (mmWave) frequencies.

5G low-loss material measurement solution

Characterizing low-loss materials in millimeter-wave (mmWave) applications requires a deep understanding of the materials' electromagnetic properties. The Keysight N1500A materials measurement suite and N5291A performance network analyzer (PNA) mmWave network analyzer enable accurate and repeatable measurement of low-loss materials used in 5G at low and mmWave frequency ranges. The PNA operates from 900 Hz to 120 GHz with a greater than 110 dB dynamic range and 0.003 dB RMS trace noise.

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