i3070 Series 7i E9988GL, Inline High-Density In-Circuit Test System
Data Sheets
The Keysight i3070 Series 7i inline test system equipped with Quad-Density Pin Cards can provide up to 5760 test nodes in a slim footprint, allowing manufacturers to economically meet increasing test demands for large pin count digital devices while protecting their existing investments by maintaining backward compatibility with E9988E, E9988EL test programs, and fixtures.